2011 Poster Sessions : Imperfection-Immune Carbon Nanotube VLSI Circuits

Student Name : Hai Wei, Jie (Jerry) Zhang
Advisor : Subhasish Mitra
Research Areas: Computer Systems
Abstract:
Carbon Nanotube Field-Effect Transistors (CNFETs) can potentially provide significant energy-delay-product benefits compared to silicon CMOS. However, CNFET circuits are subject to several sources of imperfections. These imperfections lead to incorrect logic functionality and substantial circuit performance variations. Processing techniques alone are inadequate to overcome the challenges resulting from these imperfections. An imperfection-immune design methodology is required. We present an overview of imperfection-immune design techniques to overcome major sources of CNFET imperfections.

Bios:
Hai Wei received his B. S. degree (with honors) in microelectronics from Tsinghua University, Beijing, China, in 2007 and M.S. degree in Electrical Engineering from Stanford University, CA in 2010. He is currently working toward the Ph.D. degree in electrical engineering at Stanford University, Stanford, CA. His research interests include the design and fabri- cation of carbon nanotube field-effect transistors and circuits and monolithic 3D integrated circuits. He is the recipient of the Stanford School of Engineering Fellowship Award.

Jie (Jerry) Zhang received his B.E. degree in Electronic Engineering from Tsinghua University, China, in 2006, and the M.S. degree in Electrical Engineering from Stanford University, CA, in 2008. He is currently pursuing the Ph.D. degree in Electrical Engineering at Stanford University, CA. He is a recipient of the Stanford Graduate Fellowship. His research interests include modeling and simulation of carbon nanotube based devices and circuits, with a focus on the variability-aware design and optimization.